Layer characterization

OFFER:

  • Step height and roughness measurement by optical and mechanical profiling
  • Intermetallic thickness layer measurement by X-ray fluorescence
  • Infrared morphology analysis (thickness, TTV, flatness, curvature ...)
  • Layer characterization by ellipsometry

Accédez aux équipements proposés

J’Y VAIS

ACHIEVEMENTS:

 

EQUIPMENT: