Material characterization and failure analysis

Layer characterization

OFFER:

Step height and roughness measurement by optical and mechanical profiling
Intermetallic thickness layer measurement by X-ray fluorescence
Infrared morphology analysis (thickness, TTV, flatness, curvature ...)
Layer characterization by ellipsometry

ACHIEVEMENTS:

Step height measurement

Intermetallic multilayer

Morphology analysis

EQUIPMENT:

Mechanical Profilometer

Optical Profilometer

Fogale Interferometer